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International Applied Reliability Symposium (ARS) 2011 will provide a forum for experts from the industry, government servants, and practitioners from all over the world working in the arena of applied reliability. The event will create an intimate environment for the professionals to discuss the application of reliability principles and valuable experiences. It would provide them an opportunity to cover all the aspects of the subject. The conference will also provide a prospect to hear about critical issues from leading speakers.
The conference will cover key topics including:
- Using life data analysis to validate the effectiveness of a corrective action
- Applications of discrete-time competing risk hazard models for the consumer lending industry
- Evaluation and extension of useful life of electronic equipment
- Asset information management – a stepping stone to reliability centered maintenance (RCM)
- Early detection of field risk potentials after market launch
- LCD TV reliability testing: an effective approach
Visitor Profile
The targeted visitors at the International Applied Reliability Symposium 2011 would include:
- Academic scientists
- Leading engineers
- Industry researchers
- Electronics engineers
- Scholar students
- Consultants
- Tool users
- Related experts
Organizer
ReliaSoft Corporation
